ASM International’s Electronic Device Failure Analysis Society Hosted “ISTFA 2017” Conference and Exposition in Pasadena, CA

The International Symposium for Testing & Failure Analysis (ISTFA) 2017, the annual conference and exposition organized by the ASM Electronic Device Failure Analysis Society, took place from November 5-9 at the Pasadena Convention Center in Pasadena, CA. It was the highest attended ISTFA in 10 years, attracting over 860 attendees and featuring a mix of new technology, exhibits, technical programming, and networking events geared toward the electronic device failure analysis industry and the theme “Striving for 100% Success Rate”.

The ISTFA 2017 technical program highlighted the latest research and industry insights from more than 120 industry experts and 18 sessions over the conference duration. Technical programs on the show floor showcased plenary speaker, Adam Steltzner, Team Leader & Chief Engineer EDL, NASA Mars Rover Curiosity, and the panel discussion: Striving for 100% Success Rate. Steltzner gave his presentation “The Right Kind of Crazy: A True Story of Teamwork, Leadership and High Stakes Innovation” to over 300 attendees.

The exhibit show floor housed 115 booths for the two-day exposition. Attendees were able to network with industry professionals while being exposed to the latest technologies in electronic device failure analysis. Additional conference highlights comprised of two educational short courses focusing on techniques and tools for failure analysts, a Tools of the Trade Tour that included 10 exhibiting companies and 200 registered attendees, and a networking event with a Mexican flare at the Westin Hotel. The event had over 300 people in attendance who enjoyed a Mariachi band, caricature artists, and more.

Overall, the event was a huge success and paved the way for the 2018 ISTFA Conference and Exposition in Phoenix. To find more information on the 2018 conference and…

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